Research on design of monitoring system for high and low temperature test chamber

The high and low temperature test chamber can provide a high temperature environment or a low temperature environment, and is mainly used to evaluate the performance of the product in high and low temperature environments. Many electronic components require routine tests to withstand high and low temperatures before they are officially put into use or mass-produced to verify the stability of their performance specifications. The electronic components and the complete machine of the product all require high and low temperature environmental tests. Various fields include automobiles, motorcycles, aerospace, industry, rockets, defense, universities, research institutes, etc. The performance of electronic components in control systems, navigation systems, display systems, etc. of these products needs to pass. High and low temperature detection. Therefore, high and low temperature test chambers play an extremely important and irreplaceable role in scientific tests and product tests. The normal operation of high and low temperature test chambers is a basic condition for ensuring the normal operation of the test. Since high and low temperature tests generally last for a long time, and work with certain noise and vibration, it may occur due to burning or damage of actuators (such as heating devices, refrigeration devices, etc.), controllers, regulators, contactors, and electrical contact thermometers. The high and low temperature test chambers are suddenly heated without heating or the heating is not controlled. There may also be abnormal cooling operations due to improper contact of the cooling actuator, solenoid valve control, compressor, water cooling system, air cooling system, etc. If the high and low temperature test chamber fails, if it is not found in time, it may cause the test result to be incorrect because the temperature is not within the specified range. If the temperature is not within the specified range, the test system or electronic components may be damaged due to overheating or excessive cooling. There is even a fire accident. Therefore, in the event of a failure of the high and low temperature test chamber, it is desirable to be able to cut off the power supply in time and eliminate the fault in time to protect various equipment. Due to the measurement conditions and our requirements for the maintenance of high and low temperature test chambers, it is necessary to measure and analyze the temperature values ​​in real time. Therefore, it is necessary to study the design of the high and low temperature test chamber monitoring system.

高低温试验箱监控系统设计的研究

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